Published April 1, 2006 | Version v1
Journal article

Fabrication of 3D micro and nanostructures for MEMS and MOEMS: an approach based on combined lithographies

  • 1. Nanyang Technological University, SME, 50 Nanyang Ave. Singapore 639798 (Singapore)
  • 2. Lab. TASC-INFM-CNR at Elettra synchrotron, S.S. 14 km 163.5, 34012 Trieste (Italy)
  • 3. Sincrotrone Trieste, Area Science Park, I-34012 Basovizza-Trieste (Italy)
  • 4. MIC- Department of Micro and Nanotechnology, Technical University of Denmark (DTU), DK-2800 Kongens Lyngby, Denmark (Denmark)
  • 5. BIONEM Lab, Universita Magna Graecia, Campus Germaneto, viale Europa 88100, Catanzaro (Italy)

Description

X-ray lithography is an established technique for the micro fabrication of MEMS and MOEMS well known for low sidewall surface roughness, submicron critical dimension, and high aspect ratio. Recently the typical characteristics of this technique has been developed approaching new opportunities deriving by the possibility to perform tilted exposure and by the combined use with electron beam lithography that allow to shape with direct patterning already the final material in 3D micro and nanostructures. The general approach is to concentrate the complexity of the multi layer fabrication process required to obtain 3D nanostructures mostly on the lithographic process. This capability represent a micro- and nanofabrication tool enabling new technologies. In this paper will be shown a multiple-tilted X-ray lithography procedure combined with e-beam lithography to create sub-micrometric patterns of arbitrary shape buried in 3D structure. The use of deep x-ray lithography in multi exposure configuration has been also exploited for the production of biodegradable 3D scaffold structures and of micro needles based transdermal delivery tools fabrication

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/34/904/jpconf6_34_150.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
34
Journal Issue
1
Journal Page Range
p. 904-911
ISSN
1742-6596

Conference

Title
International MEMS conference 2006
Acronym
iMEMS2006
Dates
9-12 May 2006
Place
Singapore (Singapore)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37058621
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ASPECT RATIO; ELECTROMECHANICS; ELECTRON BEAMS; FABRICATION; LAYERS; MICROSTRUCTURE; NANOSTRUCTURES; ROUGHNESS; SURFACES; X RADIATION
Descriptors DEC
BEAMS; DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LEPTON BEAMS; MECHANICS; PARTICLE BEAMS; RADIATIONS; SURFACE PROPERTIES