Published December 2008 | Version v1
Journal article

A simple and accurate method for calibrating the oscillation amplitude of tuning-fork based AFM sensors

  • 1. Laboratoire de Spectroscopie Ultrarapide, Ecole Polytechnique Federale de Lausanne (EPFL), CH-1015 Lausanne (Switzerland)

Description

We have developed a simple and accurate method for calibrating the amplitude of vibration of quartz tuning fork sensors commonly used in atomic force- and near field optical-microscopy. Unlike interferometric methods, which require a complex optical setup, the method we present requires only a simple measurement of the electro-mechanical properties of the tuning-fork oscillator and can be performed in a matter of minutes without disturbing the experimental setup. Comparison with interferometric methods shows that an accuracy of better than few percent can be routinely achieved.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2008.08.009

Additional details

Identifiers

DOI
10.1016/j.ultramic.2008.08.009;
PII
S0304-3991(08)00224-6;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
109
Journal Issue
1
Journal Page Range
p. 81-84
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41009595
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ACCURACY; AMPLITUDES; ATOMIC FORCE MICROSCOPY; COMPARATIVE EVALUATIONS; INTERFEROMETRY; MECHANICAL PROPERTIES; OPTICAL MICROSCOPY; OSCILLATIONS; OSCILLATORS; QUARTZ; SENSORS; TUNING
Descriptors DEC
ELECTRONIC EQUIPMENT; EQUIPMENT; EVALUATION; MICROSCOPY; MINERALS; OXIDE MINERALS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.