Published December 2008
| Version v1
Journal article
A simple and accurate method for calibrating the oscillation amplitude of tuning-fork based AFM sensors
- 1. Laboratoire de Spectroscopie Ultrarapide, Ecole Polytechnique Federale de Lausanne (EPFL), CH-1015 Lausanne (Switzerland)
Description
We have developed a simple and accurate method for calibrating the amplitude of vibration of quartz tuning fork sensors commonly used in atomic force- and near field optical-microscopy. Unlike interferometric methods, which require a complex optical setup, the method we present requires only a simple measurement of the electro-mechanical properties of the tuning-fork oscillator and can be performed in a matter of minutes without disturbing the experimental setup. Comparison with interferometric methods shows that an accuracy of better than few percent can be routinely achieved.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2008.08.009Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2008.08.009;
- PII
- S0304-3991(08)00224-6;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 109
- Journal Issue
- 1
- Journal Page Range
- p. 81-84
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41009595
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACCURACY; AMPLITUDES; ATOMIC FORCE MICROSCOPY; COMPARATIVE EVALUATIONS; INTERFEROMETRY; MECHANICAL PROPERTIES; OPTICAL MICROSCOPY; OSCILLATIONS; OSCILLATORS; QUARTZ; SENSORS; TUNING
- Descriptors DEC
- ELECTRONIC EQUIPMENT; EQUIPMENT; EVALUATION; MICROSCOPY; MINERALS; OXIDE MINERALS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.