Defect depth effect on the reflection coefficient of an open-ended coaxial sensor
- 1. University Mohamed khider of Biskra, Algeria. (Algeria)
- 2. University Mouloud Mammeri University of Tizi-Ouzou (Algeria)
- 3. Research Center in Industrial Technologies CRTI, P.O. Box 64, Cheraga 16014, Algiers (Algeria)
Description
In this paper we present a realization of an open-ended coaxial sensor of internal diameter (2a) and the outer diameter (2b) for the detection of defects in a plate of aluminum, those defects are with deferent depth and created by using electro-erosion technique. Wire with a pressure of the order of µm, the measurements of the reflection coefficients (S11) are carried out using a VNP vector network analyzer. The network analyzer has been calibrated in a frequency band from 200MHz to 20GHz. The AC voltage created between the two conductors generates an electromagnetic field across the internal dielectric. This field extends outside the cylinder to a distance comparable to its diameter 2b, which represents the thickness of the sensor-sensing material in contact with the plate. The waves are subsequently reflected to the inside of a sensor carrying information on the electromagnetic properties of the medium in contact with the sensor opening. Therefore, the sensor provides measurements in reflection mode only, giving the reflection coefficient as a function of the frequency of the waves guided and reflected at the sensor opening. The experimental results were valid in comparison comparing with the found in the literature. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/454/1/012072Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 454
- Journal Issue
- 1
- Journal Page Range
- [7 p.]
- ISSN
- 1757-899X
Conference
- Title
- International Conference on Materials Engineering and Science
- Dates
- 8 Aug 2018
- Place
- Istanbul (Turkey)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52102319
- Subject category
- S36: MATERIALS SCIENCE; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; CYLINDERS; DEFECTS; DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; ELECTROMAGNETIC FIELDS; EROSION; PLATES; REFLECTION; SENSORS; THICKNESS; VECTORS
- Descriptors DEC
- DIMENSIONS; ELEMENTS; MATERIALS; METALS; TENSORS