Published October 1, 2020 | Version v1
Journal article

The influence of excessive H2 during barrier growth on InGaN light-emitting diodes

  • 1. Key Laboratory for Renewable Energy, Beijing Key Laboratory for New Energy Materials and Devices, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190 (China)
  • 2. Fine Optical Engineering Research Center, Chengdu, 610041 (China)
  • 3. School of Mathematics and Physics, Beijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science, University of Science and Technology Beijing, Beijing 100083 (China)

Description

The influence of excessive H2 flow during barrier growth on optical and electrical properties of InGaN light-emitting diodes (LEDs) are investigated in this study. The room temperature photoluminescence of LEDs decays with excessive H2 treatment. Temperature-dependent photoluminescence (TDPL) reveals an increase of the density and a decrease of the activation energy of deep non-radiative recombination centers in the H2 treated LEDs. The external quantum efficiency (EQE) of the LEDs suffers from excessive H2 treatment. The leakage current on the reverse and forward sides of the LEDs are reduced significantly when treated with H2, which may be due to the suppressed Poole–Frenkel effect. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/2053-1591/abc18f

Additional details

Identifiers

Publishing Information

Journal Title
Materials Research Express (Online)
Journal Volume
7
Journal Issue
10
Journal Page Range
[6 p.]
ISSN
2053-1591

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52098895
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ACTIVATION ENERGY; ELECTRICAL PROPERTIES; LEAKAGE CURRENT; LIGHT EMITTING DIODES; PHOTOLUMINESCENCE; QUANTUM EFFICIENCY; TEMPERATURE DEPENDENCE
Descriptors DEC
CURRENTS; EFFICIENCY; ELECTRIC CURRENTS; EMISSION; ENERGY; LUMINESCENCE; PHOTON EMISSION; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES