Published June 1, 2006 | Version v1
Journal article

Recombination losses in STJ X-ray detectors with killed electrode

  • 1. Institute of Nuclear Physics, Lomonosov Moscow State University, 119992 Moscow (Russian Federation)
  • 2. Institute of Radio Engineering and Electronics RAS, 103907 Moscow (Russian Federation)
  • 3. Faculty of Computational Mathematics and Cybernetics, Lomonosov Moscow State University, 119992 Moscow (Russian Federation)

Description

Superconducting tunnel junction X-rays detectors Ti/Nb/Al/AlOx/Al/Nb/NbN with the Ti/Nb/Al/ killed electrode were studied under irradiation by X-rays photons of different energies produced by the fluorescence method. The nonlinearity of the detector response and the shape of the detector line were analyzed on the basis of the diffusion model taking into account the quasiparticle self-recombination and edge losses

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/43/1311/jpconf6_43_320.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
43
Journal Issue
1
Journal Page Range
p. 1311-1314
ISSN
1742-6596

Conference

Title
7. European conference on applied superconductivity
Acronym
EUCAS'05
Dates
11-15 Sep 2005
Place
Vienna (Austria)