Published August 23, 2010
| Version v1
Journal article
Structure of poly(di-n-hexylsilane) in nanoporous materials
- 1. Poltava Department of Academy of Sciences of Technological Cybernetics of the Ukraine, Poltava 36007, str. M. Biruzova 86/86 (Ukraine)
- 2. Universita degli Studi di Torino, Dipartimento di Chimica Inorganica, Fisica e dei Materiali, Via Pietro Giuria 7, 10125 Torino (Italy)
- 3. Institute of Physics, National Acad. Sci. Ukraine, Nauky Av 46, 03028 Kyiv (Ukraine)
Description
Graphical abstract: On the basis of theoretical calculations using TD/CEP-31G method we found and interpreted the complexation mechanism of poly(di-n-hexylsilane) incorporated in nanoporous materials. - Abstract: In this work the effects of solvent polarity and conformation changing on the electronic characteristics of poly(di-n-hexylsilane) incorporated in the nanoporous materials are calculated. The dependence of energy levels of electronic-excited states of investigated compounds is analyzed as a function of the Si-Si-Si-Si twist angle and length of Si-Si and Si-C bonds. The possibility of complex formation between silicon atom of polymer and oxygen ions of nanoporous materials is shown.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.chemphys.2010.06.029Additional details
Identifiers
- DOI
- 10.1016/j.chemphys.2010.06.029;
- PII
- S0301-0104(10)00297-1;
Publishing Information
- Journal Title
- Chemical Physics
- Journal Volume
- 374
- Journal Issue
- 1-3
- Journal Page Range
- p. 99-103
- ISSN
- 0301-0104
- CODEN
- CMPHC2
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43121766
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- EXCITED STATES; OSCILLATOR STRENGTHS; OXYGEN IONS; POLYMERS; SILANES; SOLVENTS
- Descriptors DEC
- CHARGED PARTICLES; ENERGY LEVELS; HYDRIDES; HYDROGEN COMPOUNDS; IONS; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.