Characteristic of the carbon–tungsten co-deposition layers prepared by RF magnetron sputtering in a D2/Ar plasma
- 1. Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433 (China)
- 2. Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031 (China)
Description
A C–W co-deposition layer, formed by radio frequency magnetron sputtering, was investigated to identify the characteristics of C–W mixed layers in fusion experimental reactors. The layers were characterized by ion beam analysis, Raman spectroscopy, X-ray diffraction and scanning electron microscopy. It was found that D atoms in C–W layers were mainly trapped by the C atoms. The ratio of C/W and D concentrations in the C–W layers deposited at a pressure of 5.0 Pa and a fixed flow rate ratio were 54/31 and 5%, respectively. They all increased significantly with increased flow rate of D2 but decreased with temperature at a relatively low level. The pressure dependence of the D concentration showed a maximum value around 5 Pa and it decreased with rising or decreasing pressure. Both Raman and X-ray analysis revealed that the structure of the C–W layers became more graphite-like with increasing temperature. Moreover, deuterium introduction made the tungsten carbide phase disappear in the deuterated C–W layers. Only erosion caves on the surface of the sample prepared at 300 K were observed by SEM. When the temperature increased, they disappeared, and convex bodies appeared
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.04.052Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.04.052;
- PII
- S0168-583X(13)00456-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 305
- Journal Page Range
- p. 55-60
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45065148
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CONCENTRATION RATIO; DEPOSITION; DEUTERIUM; GRAPHITE; LAYERS; MAGNETRONS; PLASMA; PRESSURE DEPENDENCE; RADIOWAVE RADIATION; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SPUTTERING; TUNGSTEN CARBIDES; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- CARBIDES; CARBON; CARBON COMPOUNDS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; HYDROGEN ISOTOPES; IONIZING RADIATIONS; ISOTOPES; LASER SPECTROSCOPY; LIGHT NUCLEI; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MINERALS; NONMETALS; NUCLEI; ODD-ODD NUCLEI; RADIATIONS; REFRACTORY METAL COMPOUNDS; SCATTERING; SPECTROSCOPY; STABLE ISOTOPES; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.