Large-scale lithography for sub-500nm features
- 1. Technology group, EV Group, DI Erich Thallner Str. 1, A-4780 Schaerding (Austria)
- 2. CNRS, Institut d'Electronique Fondamentale, Universite Paris-Sud Bat 220, F- 91405 Orsay Cedex (France)
Description
The interest in micro- and nanotechnologies has grown rapidly in the last years. The applications are versatile and different techniques found its way into several research domains as optics, electronics, magnetism, fluidics, etc. In all of these fields integration of more and more functions on steadily decreasing device dimensions lead to an increase in structural density and feature size. Expensive and slow processes utilizing projection steppers or e-beam direct writer equipment are used to fabricate nm features today. A high throughput and cost effective method adapted on a standard mask aligner will be demonstrated, making features of below 300nm available on wafer-level. We will demonstrate results of 4 different resists exposed on a DUV proximity aligner and plasma etched for optical and biological applications in the sub-300nm range
Availability note (English)
Available online at http://stacks.iop.org/1742-6596/34/34/jpconf6_34_006.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 34
- Journal Issue
- 1
- Journal Page Range
- p. 34-38
- ISSN
- 1742-6596
Conference
- Title
- International MEMS conference 2006
- Acronym
- iMEMS2006
- Dates
- 9-12 May 2006
- Place
- Singapore (Singapore)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37058482
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DENSITY; MAGNETISM; MASKING; NANOSTRUCTURES; OPTICS; PLASMA
- Descriptors DEC
- PHYSICAL PROPERTIES