Published April 1, 2006 | Version v1
Journal article

Large-scale lithography for sub-500nm features

  • 1. Technology group, EV Group, DI Erich Thallner Str. 1, A-4780 Schaerding (Austria)
  • 2. CNRS, Institut d'Electronique Fondamentale, Universite Paris-Sud Bat 220, F- 91405 Orsay Cedex (France)

Description

The interest in micro- and nanotechnologies has grown rapidly in the last years. The applications are versatile and different techniques found its way into several research domains as optics, electronics, magnetism, fluidics, etc. In all of these fields integration of more and more functions on steadily decreasing device dimensions lead to an increase in structural density and feature size. Expensive and slow processes utilizing projection steppers or e-beam direct writer equipment are used to fabricate nm features today. A high throughput and cost effective method adapted on a standard mask aligner will be demonstrated, making features of below 300nm available on wafer-level. We will demonstrate results of 4 different resists exposed on a DUV proximity aligner and plasma etched for optical and biological applications in the sub-300nm range

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/34/34/jpconf6_34_006.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
34
Journal Issue
1
Journal Page Range
p. 34-38
ISSN
1742-6596

Conference

Title
International MEMS conference 2006
Acronym
iMEMS2006
Dates
9-12 May 2006
Place
Singapore (Singapore)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37058482
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DENSITY; MAGNETISM; MASKING; NANOSTRUCTURES; OPTICS; PLASMA
Descriptors DEC
PHYSICAL PROPERTIES