The stand-alone microprobe at Livermore
Description
Lawrence Livermore National Laboratory (LLNL) and Sandia National Laboratories/California have jointly constructed a new stand-alone microprobe facility. Although the facility was built to develop a method to rapidly locate and determine elemental concentrations of micron scale particulates on various media using PIXE, the facility has found numerous applications in biology and materials science. The facility is located at LLNL and uses a General Ionex Corporation Model 358 duoplasmatron negative ion source, a National Electrostatics Corporation 5SDH-2 tandem accelerator, and an Oxford triplet lens. Features of the system include complete computer control of the beam transport using LabVIEWTM for Macintosh, computer controlled beam collimating and divergence limiting slits, automated sample positioning to micron resolution, and video optics for beam positioning and sample observation. Data collection is accomplished with the simultaneous use of as many as four EG and G Ortec IGLET-XTM X-Ray detectors, digital amplifiers made by X-Ray Instruments and Associates (XIA), and LabVIEWTM for Macintosh acquisition software
Additional details
Identifiers
- PII
- S0168583X99003626;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 158
- Journal Issue
- 1-4
- Journal Page Range
- p. 24-30
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33028799
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COLLIMATORS; COMPUTERIZED CONTROL SYSTEMS; DATA ACQUISITION SYSTEMS; HYDROGEN IONS 1 MINUS; ION MICROPROBE ANALYSIS; ION SOURCES; LAWRENCE LIVERMORE NATIONAL LABORATORY; PELLETRON ACCELERATORS; PIXE ANALYSIS; SPATIAL RESOLUTION; TANDEM ELECTROSTATIC ACCELERATORS
- Descriptors DEC
- ACCELERATORS; ANIONS; CHARGED PARTICLES; CHEMICAL ANALYSIS; CONTROL SYSTEMS; ELECTROSTATIC ACCELERATORS; HYDROGEN IONS; IONS; MICROANALYSIS; NATIONAL ORGANIZATIONS; NONDESTRUCTIVE ANALYSIS; ON-LINE CONTROL SYSTEMS; ON-LINE SYSTEMS; RESOLUTION; US DOE; US ORGANIZATIONS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.