Dispersing artifacts in FT-STS: a comparison of set point effects across acquisition modes
Creators
- 1. Department of Physics and Astronomy, University of British Columbia, Vancouver, BC, Canada V6T 1Z1 (Canada)
- 2. Stewart Blusson Quantum Matter Institute, University of British Columbia, Vancouver, BC, Canada, V6T 1Z4 (Canada)
- 3. Department of Physics and Astronomy, University of Tennessee, Knoxville, TN 37996-1200 (United States)
Description
Fourier-transform scanning tunnelling spectroscopy (FT-STS), or quasiparticle interference, has become an influential tool for the study of a wide range of important materials in condensed matter physics. However, FT-STS in complex materials is often challenging to interpret, requiring significant theoretical input in many cases, making it crucial to understand potential artifacts of the measurement. Here, we compare the most common modes of acquiring FT-STS data and show through both experiment and simulations that artifact features can arise that depend on how the tip height is stabilized throughout the course of the measurement. The most dramatic effect occurs when a series of d I /d V maps at different energies are acquired with simultaneous constant current feedback; here a feature that disperses in energy appears that is not observed in other measurement modes. Such artifact features are similar to those arising from real physical processes in the sample and are susceptible to misinterpretation. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/27/41/414004Additional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 27
- Journal Issue
- 41
- Journal Page Range
- [7 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50039342
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; ELECTRIC CURRENTS; FEEDBACK; FOURIER TRANSFORMATION; INTERFERENCE; SCANNING TUNNELING MICROSCOPY
- Descriptors DEC
- CURRENTS; EVALUATION; INTEGRAL TRANSFORMATIONS; MICROSCOPY; SIMULATION; TRANSFORMATIONS