Published June 2001
| Version v1
Journal article
Modification in etching characteristics and surface topography of some electron irradiated polymers
Description
Track formation in polymers is a complex phenomenon in which not only primary but also secondary processes, such as formation of radicals and chemical processes, are involved. In the present work, the influence of 2 MeV electrons on the etching properties and the surface topography of polyethylene terephthalate (PET) and polyimide (PI) are studied. The increase in the bulk etch-rate and a decrease in the activation energy of etching were observed for both the polymers. The surface roughness of both polymers was reduced due to electron irradiation
Additional details
Identifiers
- PII
- S1350448701001287;
Publishing Information
- Journal Title
- Radiation Measurements
- Journal Volume
- 34
- Journal Issue
- 1-6
- Journal Page Range
- p. 95-98
- ISSN
- 1350-4487
- CODEN
- RMEAEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- Syrian Arab Republic
- INIS RN
- 33037227
- Subject category
- S38: RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACTIVATION ENERGY; ELECTRON BEAMS; ETCHING; IRRADIATION; MEV RANGE 01-10; PARTICLE TRACKS; POLYESTERS; POLYMERS; SURFACE PROPERTIES
- Descriptors DEC
- BEAMS; ENERGY; ENERGY RANGE; ESTERS; LEPTON BEAMS; MEV RANGE; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PARTICLE BEAMS; POLYMERS; SURFACE FINISHING
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.