Surface structure analysis of metal adsorbed Si(1 1 1) surfaces by Patterson function with LEED I-V curves
Creators
- 1. Faculty of Engineering, Kobe University, Rokkodai, Nada, Kobe 657-8501 (Japan)
Description
Wu and Tong proposed the calculation method of Patterson function obtained directly from the LEED I-V curves which shows the relative position of surface atoms as an image. We have made the calculation program of Patterson function and applied to the structural analysis of the Si(1 1 1)1 x 1-Fe surface. Surface structure was able to be expressed almost correctly by the Patterson function obtained from the theoretical I-V curves for the model structure. In the Patterson function obtained from the experimental I-V curves, the locational relation between the atoms of subsurface layer was in agreement with the CsCl type structure. More over, because the faint peak, by which we can distinguish the model, can be seen, it seems that the model B8 is preferable to the model A8. This result is consistent with the model shown by Walter et al
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2008.02.092Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2008.02.092;
- PII
- S0169-4332(08)00363-2;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 254
- Journal Issue
- 23
- Journal Page Range
- p. 7824-7826
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 9. international conference on atomically controlled surfaces, interfaces and nanostructures
- Acronym
- ASCIN-9
- Dates
- 11-15 Nov 2007
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40032185
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALCULATION METHODS; ELECTRON DIFFRACTION; LAYERS; METALS; SILICON; SURFACES
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELEMENTS; SCATTERING; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.