Published September 30, 2008 | Version v1
Journal article

Surface structure analysis of metal adsorbed Si(1 1 1) surfaces by Patterson function with LEED I-V curves

  • 1. Faculty of Engineering, Kobe University, Rokkodai, Nada, Kobe 657-8501 (Japan)

Description

Wu and Tong proposed the calculation method of Patterson function obtained directly from the LEED I-V curves which shows the relative position of surface atoms as an image. We have made the calculation program of Patterson function and applied to the structural analysis of the Si(1 1 1)1 x 1-Fe surface. Surface structure was able to be expressed almost correctly by the Patterson function obtained from the theoretical I-V curves for the model structure. In the Patterson function obtained from the experimental I-V curves, the locational relation between the atoms of subsurface layer was in agreement with the CsCl type structure. More over, because the faint peak, by which we can distinguish the model, can be seen, it seems that the model B8 is preferable to the model A8. This result is consistent with the model shown by Walter et al

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.02.092

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.02.092;
PII
S0169-4332(08)00363-2;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
254
Journal Issue
23
Journal Page Range
p. 7824-7826
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
9. international conference on atomically controlled surfaces, interfaces and nanostructures
Acronym
ASCIN-9
Dates
11-15 Nov 2007
Place
Tokyo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40032185
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CALCULATION METHODS; ELECTRON DIFFRACTION; LAYERS; METALS; SILICON; SURFACES
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELEMENTS; SCATTERING; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.