Published December 1, 2008
| Version v1
Journal article
X-ray diffraction study of gold nitride films: Observation of a solid solution phase
- 1. School of Chemical Engineering and Advanced Materials, University of Newcastle upon Tyne, Newcastle upon Tyne NE1 7RU (United Kingdom)
- 2. Department of Physics, University of Warwick, Coventry CV4 7AL (United Kingdom)
- 3. Department of Physics, University of Durham, Durham DH1 3LE (United Kingdom)
Description
The structure of nitride containing gold films produced by reactive ion sputtering and nitrogen plasma etching is investigated using x-ray photoelectron spectroscopy and x-ray diffraction. It is found that gold nitride is a solid solution of nitrogen atoms dissolved in a fcc gold matrix. Differences between the strain and lattice parameters of gold and gold nitride films were observed and are explained by interstitial nitrogen present in the latter
Additional details
Identifiers
- DOI
- 10.1063/1.3040717;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 104
- Journal Issue
- 11
- Journal Page Range
- p. 113527-113527.5
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40054200
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ETCHING; FCC LATTICES; GOLD; GOLD COMPOUNDS; INTERSTITIALS; LATTICE PARAMETERS; NITRIDES; NITROGEN; SOLID SOLUTIONS; SPUTTERING; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DIFFRACTION; DISPERSIONS; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; HOMOGENEOUS MIXTURES; METALS; MIXTURES; NITROGEN COMPOUNDS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PNICTIDES; POINT DEFECTS; SCATTERING; SOLUTIONS; SPECTROSCOPY; SURFACE FINISHING; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2008 American Institute of Physics