QC of heavy ion therapy using intensifying screen-CCD camera system
- 1. Ibaraki Prefectural Univ. of Health Sciences, Ami, Ibaraki (Japan)
Description
The Frequency-Distance Relation (FDR) method is a well-known powerful method that can improve the spatial resolution of a reconstructed image in single photon emission computed tomography (SPECT). This method is based on the Fourier correction of spatially variant collimator blurring. It may be applicable to the correction for spatially variant multiple Coulomb scattering blurring in heavy ion CT. In this paper, we report on the preliminary results of an application of FDR to a sinogram, which was measured by a heavy ion CT system based on the measurement of residual range distribution. Furthermore, photoluminescence spectra of an intensifying screen for the heavy ion beam and X-ray beam were measured to investigate the improvement of sensitivity of screen-charge coupled device (CCD) camera. (author)
Additional details
Publishing Information
- Imprint Title
- 2005 annual report of the research project with heavy ions at NIRS-HIMAC
- Imprint Pagination
- 328 p.
- Journal Page Range
- p. 265-266
- Report number
- NIRS-M--192
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 38059590
- Subject category
- S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- BRAGG CURVE; CARBON 12 BEAMS; CHARGE-COUPLED DEVICES; CROSS SECTIONS; EMISSION SPECTRA; HEAVY IONS; HIMAC ACCELERATOR; HUMIDITY; IMAGE PROCESSING; PHANTOMS; PHOTOLUMINESCENCE; PMMA; QUALITY CONTROL; RADIOTHERAPY; SPATIAL RESOLUTION; X RADIATION
- Descriptors DEC
- ACCELERATORS; BEAMS; CHARGED PARTICLES; CONTROL; CYCLIC ACCELERATORS; DIAGRAMS; ELECTROMAGNETIC RADIATION; EMISSION; ESTERS; HEAVY ION ACCELERATORS; INFORMATION; ION BEAMS; IONIZING RADIATIONS; IONS; LUMINESCENCE; MEDICINE; MOCKUP; MOISTURE; NUCLEAR MEDICINE; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PHOTON EMISSION; POLYACRYLATES; POLYMERS; POLYVINYLS; PROCESSING; RADIATIONS; RADIOLOGY; RESOLUTION; SEMICONDUCTOR DEVICES; SPECTRA; STRUCTURAL MODELS; SYNCHROTRONS; THERAPY
Optional Information
- Secondary number(s)
- HIMAC--115