Published July 15, 2000
| Version v1
Journal article
Anticompton spectrometer element studies
Creators
Description
Sensitive measurements of the trace elements require the use of an active suppression of the overall detection background. For this reason, an anticompton system made of NaI and HPGe has been constructed at the new underground laboratory in Garching near Munich for analysis of irradiated samples. Significantly improved limits for trace elements' concentration in nylon have been obtained. A suppression factor of 16 in the energy region of 100-400 keV was reached
Additional details
Identifiers
- PII
- S0969804300001780;
Publishing Information
- Journal Title
- Applied Radiation and Isotopes
- Journal Volume
- 53
- Journal Issue
- 1-2
- Journal Page Range
- p. 231-236
- ISSN
- 0969-8043
- CODEN
- ARISEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- Belarus
- INIS RN
- 33030219
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ACTIVATION ANALYSIS; BACKGROUND RADIATION; COMPTON SPECTROMETERS; ELEMENTS; HIGH-PURITY GE DETECTORS; KEV RANGE 100-1000; LOW LEVEL COUNTING; NAI DETECTORS; NYLON; RADIATION MONITORING; SENSITIVITY; TRACE AMOUNTS; UNDERGROUND FACILITIES
- Descriptors DEC
- CHEMICAL ANALYSIS; COUNTING TECHNIQUES; ENERGY RANGE; GAMMA SPECTROMETERS; GE SEMICONDUCTOR DETECTORS; KEV RANGE; MATERIALS; MEASURING INSTRUMENTS; MONITORING; NONDESTRUCTIVE ANALYSIS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; PLASTICS; POLYAMIDES; POLYMERS; RADIATION DETECTORS; RADIATIONS; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SOLID SCINTILLATION DETECTORS; SPECTROMETERS; SYNTHETIC MATERIALS
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.