Published 1979
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Investigation of temperature dependence of muonic X-ray spectra structure in silicon and vanadium oxides
Description
To study the influence of matter macroscopic properties on the negative muon atomic capture the muonic X-ray spectra have been measured from silicon at 77 deg and 295 deg, from VO2 at 295 deg and 355 deg, and from V2O3 at 77 deg and 295 deg using a Ge(Li) spectrometer 55 cm3 in volume and ''on-line'' technique. It is shown that neither changes of a conductivity in all targets, nor a rebuilding of both vanadium oxydes crystal structure at phase transition does not cause any alteration in muonic X-ray spectrum. The obtained results are discussed in terms of a ''time pit''
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Additional details
Additional titles
- Original title (Russian)
- Исследование температурной зависимости структуры мю-мезорентгеновских спектров в кремнии и оксидах ванадия
Publishing Information
- Imprint Pagination
- 6 p.
- Report number
- JINR-R--15-12904
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 11555961
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AUGER EFFECT; CRYSTAL-PHASE TRANSFORMATIONS; DE-EXCITATION; ELECTRIC CONDUCTIVITY; LI-DRIFTED DETECTORS; LOW TEMPERATURE; MEDIUM TEMPERATURE; MUONIC ATOMS; MUONS MINUS; SILICON; TEMPERATURE DEPENDENCE; VANADIUM OXIDES; X-RAY SPECTRA
- Descriptors DEC
- ATOMS; CHALCOGENIDES; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; ELEMENTS; ENERGY-LEVEL TRANSITIONS; FERMIONS; HADRONIC ATOMS; LEPTONS; MEASURING INSTRUMENTS; MESIC ATOMS; MUONS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SPECTRA; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Notes
- 21 refs.; 1 fig.