Published 1979 | Version v1
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Investigation of temperature dependence of muonic X-ray spectra structure in silicon and vanadium oxides

Description

To study the influence of matter macroscopic properties on the negative muon atomic capture the muonic X-ray spectra have been measured from silicon at 77 deg and 295 deg, from VO2 at 295 deg and 355 deg, and from V2O3 at 77 deg and 295 deg using a Ge(Li) spectrometer 55 cm3 in volume and ''on-line'' technique. It is shown that neither changes of a conductivity in all targets, nor a rebuilding of both vanadium oxydes crystal structure at phase transition does not cause any alteration in muonic X-ray spectrum. The obtained results are discussed in terms of a ''time pit''

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MF available from INIS under the Report Number.

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Additional details

Additional titles

Original title (Russian)
Исследование температурной зависимости структуры мю-мезорентгеновских спектров в кремнии и оксидах ванадия

Publishing Information

Imprint Pagination
6 p.
Report number
JINR-R--15-12904

Optional Information

Notes
21 refs.; 1 fig.