Published October 2008 | Version v1
Journal article

High resolution beam line for the SHARAQ spectrometer

  • 1. Center for Nuclear Study, University of Tokyo, Wako, Saitama 351-0198 (Japan)
  • 2. Physics Department, University of Notre Dame, Notre Dame, IN 46556 (United States)
  • 3. RIKEN - Institute of Physical and Chemical Research, Wako, Saitama 351-0198 (Japan)
  • 4. Department of Physics, University of Tokyo, Bunkyo, Tokyo 113-0033 (Japan)

Description

The high resolution beam line for the SHARAQ spectrometer was designed to satisfy the lateral and angular dispersion matching conditions based on the precise ion optical calculation using the measured magnetic field maps of the beam line magnets. The higher order aberration due to the large emittance of the secondary RI-beams was corrected by employing the three octupole magnets. A Monte Carlo calculation was carried out to examine the beam profile on the SHARAQ target, and it was found that the octupole magnets actually correct the higher order aberration.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2008.05.026

Additional details

Identifiers

DOI
10.1016/j.nimb.2008.05.026;
PII
S0168-583X(08)00705-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
266
Journal Issue
19-20
Journal Page Range
p. 4201-4204
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
15. international conference on electromagnetic isotope separators and techniques related to their applications
Dates
24-29 Jun 2007
Place
Deauville (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41015364
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM PROFILES; BEAM TRANSPORT; MAGNETIC FIELDS; MAGNETIC SPECTROMETERS; MAGNETS; MONTE CARLO METHOD; OCTUPOLES; RADIOACTIVE ION BEAMS; RESOLUTION
Descriptors DEC
BEAMS; CALCULATION METHODS; EQUIPMENT; ION BEAMS; MEASURING INSTRUMENTS; MULTIPOLES; SPECTROMETERS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.