Published August 1, 2009
| Version v1
Journal article
Low-noise multichannel ASIC for high count rate X-ray diffractometry applications
- 1. AGH University of Science and Technology, Department of Measurement and Instrumentation, al. Mickiewicza 30, Krakow (Poland)
- 2. Rigaku Corporation, 3-9-12 Matsubara-cho, Akishima-shi, Tokyo (Japan)
Description
RG64 is a 64-channel ASIC designed for the silicon strip detector readout and optimized for high count rate X-ray imaging applications. In this paper we report on the test results referring to the RG64 noise level, channel uniformity and the operation with a high rate of input signals. The parameters of the RG64-based diffractometry system are compared with the ones based on the scintillation counter. Diffractometry measurement results with silicon strip detectors of different strip lengths and strip pitch are also presented.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2009.03.161Additional details
Identifiers
- DOI
- 10.1016/j.nima.2009.03.161;
- PII
- S0168-9002(09)00652-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 607
- Journal Issue
- 1
- Journal Page Range
- p. 229-232
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 10.international workshop on radiation imaging detectors
- Dates
- 29 Jun - 3 Jul 2008
- Place
- Helsinki (Finland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41044984
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COUNTING RATES; NOISE; OPERATION; READOUT SYSTEMS; SCINTILLATION COUNTERS; SI MICROSTRIP DETECTORS; SIGNALS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SCATTERING; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.