Published August 1, 2009 | Version v1
Journal article

Low-noise multichannel ASIC for high count rate X-ray diffractometry applications

  • 1. AGH University of Science and Technology, Department of Measurement and Instrumentation, al. Mickiewicza 30, Krakow (Poland)
  • 2. Rigaku Corporation, 3-9-12 Matsubara-cho, Akishima-shi, Tokyo (Japan)

Description

RG64 is a 64-channel ASIC designed for the silicon strip detector readout and optimized for high count rate X-ray imaging applications. In this paper we report on the test results referring to the RG64 noise level, channel uniformity and the operation with a high rate of input signals. The parameters of the RG64-based diffractometry system are compared with the ones based on the scintillation counter. Diffractometry measurement results with silicon strip detectors of different strip lengths and strip pitch are also presented.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.03.161

Additional details

Identifiers

DOI
10.1016/j.nima.2009.03.161;
PII
S0168-9002(09)00652-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
607
Journal Issue
1
Journal Page Range
p. 229-232
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
10.international workshop on radiation imaging detectors
Dates
29 Jun - 3 Jul 2008
Place
Helsinki (Finland)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41044984
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COUNTING RATES; NOISE; OPERATION; READOUT SYSTEMS; SCINTILLATION COUNTERS; SI MICROSTRIP DETECTORS; SIGNALS; X RADIATION; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SCATTERING; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.