Compaction of poly(dimethylsiloxane) (PDMS) due to proton beam irradiation
- 1. Institute of Nuclear Research of the Hungarian Academy of Sciences, H-4001 Debrecen, P.O. Box 51 (Hungary)
- 2. Department of Optics and Quantum Electronics, University of Szeged, Dom ter 9, H-6720 Szeged (Hungary)
Description
This work is about the detailed investigation of the changes of the surface topography, the degree of compaction/shrinkage and its relation to the irradiation fluence and the structure spacing in poly(dimethylsiloxane) (PDMS) patterned with 2 MeV proton microbeam. The irradiated periodic structures consisted of parallel lines with different widths and spacing. To achieve different degrees of compaction, each structure was irradiated with more different fluences. At the irradiated areas the surface topography, the adhesion, the wettability and the rigidity of the surface also changes due to the chemical/structural change of the basic poly(dimethylsiloxane) polymer. The surface topography, the phase modification of the surface, and the connection between them was revealed with using an atomic force microscope (AFM).
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2010.12.095Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2010.12.095;
- PII
- S0169-4332(10)01824-6;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 257
- Journal Issue
- 10
- Journal Page Range
- p. 4612-4615
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44024368
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ADHESION; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; IRRADIATION; MEV RANGE 01-10; MODIFICATIONS; ORGANIC COMPOUNDS; PERIODICITY; PHYSICAL RADIATION EFFECTS; POLYMERS; PROTON BEAMS; PROTONS; SHRINKAGE; SURFACES; SYMMETRY; TOPOGRAPHY; WETTABILITY
- Descriptors DEC
- BARYONS; BEAMS; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; HADRONS; MEV RANGE; MICROSCOPY; NUCLEON BEAMS; NUCLEONS; PARTICLE BEAMS; RADIATION EFFECTS; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.