Ion beam mixing of bimetallic systems: CEMS studies

The effect of irradiation with argon, krypton and xenon energetic ions of bimetallic systems containing a Moessbauer active element is reviewed to show the contribution of conversion electron Moessbauer spectroscopy (CEMS) to the studies of the ion-beam mixing mechanisms and to the structural characterization of mixed interfaces. In the field of ion beam mixing, CEMS is often used to complement the more used RBS, TEM, XRD, XPS, SIMS, AES and SEM analytical techniques. Recent results concerning the Fe/Pd, Fe/Ni and Fe/Al couples mixed with argon and krypton ions are presented and discussed. (orig.)