Published October 2011
| Version v1
Journal article
Highly-charged-ion-induced electron emission from C60 thin films
- 1. Institute of Applied Physics, TU Wien-Vienna University of Technology, A-1040 Vienna (Austria)
- 2. KVI-Atomic and Molecular Physics, University of Groningen, Zernikelaan 25, NL-9747 AA Groningen (Netherlands)
Description
The secondary electron yields as a result of highly charged ions impinging on clean Au(111) and thin films of C60 on Au have been measured. This has been done for film thicknesses of one to five monolayers and several charge states of Ar and Xe ions. For all ions an increase of 35% in the secondary electron yield is observed when going from Au(111) to multiple C60 layers. The increase remains constant for a wide range (7-26) of charge states. Possible scenarios are given to explain the increase in electron yield.
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. A
- Journal Volume
- 84
- Journal Issue
- 4
- Journal Page Range
- p. 042901-042901.6
- ISSN
- 1050-2947
- CODEN
- PLRAAN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44053499
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ELECTRON EMISSION; ELECTRONS; FULLERENES; THIN FILMS; XENON IONS
- Descriptors DEC
- CARBON; CHARGED PARTICLES; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; FERMIONS; FILMS; IONS; LEPTONS; NONMETALS
Optional Information
- Notes
- (c) 2011 American Institute of Physics