Published May 1992 | Version v1
Report

The use of an electron beam ion trap in the study of highly charged ions

Description

The Electron Beam Ion Trap (EBIT) is a new instrument for the study of X-rays produced by very-highly-charged ions when they interact with free electrons. This paper describes some of the design and physics features of EBIT. We include a report of the progress in the measurement of the electron beam density and energy variance and a description and results of using open-quotes evaporative coolingclose quotes of the ions. We review some of the measurements of dielectronic recombination in Ni26+ and Au69+, electron impact excitation in Ba46+ and Au69+, precision spectroscopy of hydrogen-like nickel and measurement of relative line intensities for use in plasma diagnostics in Ba46+

Part of:
EBIT: Electron beam ion trap

Additional details

Publishing Information

Imprint Title
EBIT: Electron beam ion trap
Imprint Pagination
308 p.
Journal Page Range
p. 91-100.
Report number
UCRL-ID--110491

Optional Information

Contract/Grant/Project number
Contract W-7405-ENG-48