A discussion regarding the approximation of cylindrical and spherical shaped samples as half spaces in AFM nanoindentation experiments
Creators
- 1. Mobile Radio Communications Laboratory, School of Electrical and Computer Engineering, National Technical University of Athens (Greece)
- 2. Cancer Biophysics Laboratory, Department of Mechanical and Manufacturing Engineering, Faculty of Engineering, University of Cyprus (Cyprus)
- 3. Radar Systems and Remote Sensing Lab of School of Electrical and Computer Engineering of National Technical University of Athens (Greece)
Description
A common assumption of nanoidentation experiments is to consider the sample as an elastic half space due to the simplicity of the analysis regarding the Young's modulus calculation. However, in the nano—dimensions a sample cannot be considered as a half space and this approximation can lead to significant errors in the analysis. In this paper, the Atomic Force Microscopy (AFM) nanoindentation method on cylindrical and spherical shaped samples is discussed. The purpose of this paper is to investigate the errors that arise under the assumption that a cylindrical/spherical shaped sample is a half space and to provide a simplified methodology to reduce these errors. The new approach can be applied to AFM nanoindentation experiments on cylindrical or spherical biological samples (e.g. collagen fibers and cells). (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/aad2c9Additional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 5
- Journal Issue
- 8
- Journal Page Range
- [11 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51080566
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CYLINDRICAL CONFIGURATION; ERRORS; SPACE; SPHERICAL CONFIGURATION
- Descriptors DEC
- CONFIGURATION; MICROSCOPY