Space station application of CCD image sensors for x-ray imaging
Creators
- 1. Princeton Scientific Instruments, Inc. 7 Deer Park Drive Monmouth Junction, New Jersey 08852 (United States)
Description
Charge Coupled Device (CCD) type solid state image sensors are employed in a number of space based imaging experiments and will be the basis for a camera system to acquire x-ray diffraction images on board the Space Station. This paper will present the system engineering considerations that led to the selection of CCDs over other x-ray imaging technologies and the design of the camera system. This will include discussion of the special requirements imposed by the space environment and this x-ray crystallography mission. This systems engineering discussion will be followed by a summary of high spatial resolution CCDs that are candidates for this camera, what may become available in the future, and what improvements would make CCDs even more suited to such X-ray imaging applications on the ground as well as in space
Additional details
Identifiers
- DOI
- 10.1063/1.52072;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 387
- Journal Issue
- 1
- Journal Page Range
- p. 725-732
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- Space technology and applications international forum
- Acronym
- STAIF-97
- Dates
- 26-30 Jan 1997
- Place
- Albuquerque, NM (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40042303
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAMERAS; CHARGE-COUPLED DEVICES; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DESIGN; IMAGES; INTERNATIONAL SPACE STATION; SENSORS; SOLIDS; SPATIAL RESOLUTION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; RESOLUTION; SCATTERING; SEMICONDUCTOR DEVICES
Optional Information
- Notes
- (c) 1997 American Institute of Physics.