Published October 1, 2006 | Version v1
Journal article

Crystal cavity resonance for hard x rays: A diffraction experiment

  • 1. National Synchrotron Radiation Research Center (NSRRC), Hsinchu, Taiwan, 300 (China)
  • 2. Department of Physics, National Tsing Hua University (NTHU), Hsinchu, Taiwan, 300 (China)
  • 3. Spring-8/JASRI, Mikazuki, Hyogo 679-5198 (Japan)
  • 4. Spring-8/RIKEN, Mikazuki, Hyogo 679-5148 (Japan)
  • 5. Scientific Instrumentation Research and Development Center, Hsinchu, Taiwan, 300 (China)

Description

We report the details of the recent x-ray back diffraction experiments, in which interference fringes due to x-ray cavity resonance are unambiguously observed. The Fabry-Perot type cavities, the tested crystal devices of reflectivity R≅0.5 and finesse F≅2.3, consist of monolithic two-plate and eight-plate silicon crystals. They were prepared by using x-ray lithographic techniques. The thicknesses of the crystal plates and the gaps between the two adjacent plates are a few tens to hundreds μm. The (12 4 0) back reflection and synchrotron x-radiation of energy resolution ΔE=0.36 meV at 14.4388 keV are employed. Interference fringes in angle- and photon-energy scans for two-plate and eight-plate cavities are shown. Considerations on the temporal and spatial coherence for observable resonance interference fringes using synchrotron x-rays are presented. The details about the accompanied simultaneous 24-beam diffraction in relation to x-ray photon energy are also described

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. B, Condensed Matter and Materials Physics
Journal Volume
74
Journal Issue
13
Journal Page Range
p. 134111-134111.7
ISSN
1098-0121

Optional Information

Notes
(c) 2006 The American Physical Society