Crystal cavity resonance for hard x rays: A diffraction experiment
Creators
- 1. National Synchrotron Radiation Research Center (NSRRC), Hsinchu, Taiwan, 300 (China)
- 2. Department of Physics, National Tsing Hua University (NTHU), Hsinchu, Taiwan, 300 (China)
- 3. Spring-8/JASRI, Mikazuki, Hyogo 679-5198 (Japan)
- 4. Spring-8/RIKEN, Mikazuki, Hyogo 679-5148 (Japan)
- 5. Scientific Instrumentation Research and Development Center, Hsinchu, Taiwan, 300 (China)
Description
We report the details of the recent x-ray back diffraction experiments, in which interference fringes due to x-ray cavity resonance are unambiguously observed. The Fabry-Perot type cavities, the tested crystal devices of reflectivity R≅0.5 and finesse F≅2.3, consist of monolithic two-plate and eight-plate silicon crystals. They were prepared by using x-ray lithographic techniques. The thicknesses of the crystal plates and the gaps between the two adjacent plates are a few tens to hundreds μm. The (12 4 0) back reflection and synchrotron x-radiation of energy resolution ΔE=0.36 meV at 14.4388 keV are employed. Interference fringes in angle- and photon-energy scans for two-plate and eight-plate cavities are shown. Considerations on the temporal and spatial coherence for observable resonance interference fringes using synchrotron x-rays are presented. The details about the accompanied simultaneous 24-beam diffraction in relation to x-ray photon energy are also described
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 74
- Journal Issue
- 13
- Journal Page Range
- p. 134111-134111.7
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38026726
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- CAVITY RESONATORS; CRYSTALS; ENERGY RESOLUTION; HARD X RADIATION; INTERFERENCE; KEV RANGE; PHOTONS; PLATES; REFLECTION; REFLECTIVITY; RESONANCE; SEMICONDUCTOR MATERIALS; SILICON; THICKNESS; X-RAY DIFFRACTION
- Descriptors DEC
- BOSONS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; EQUIPMENT; IONIZING RADIATIONS; MASSLESS PARTICLES; MATERIALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; RESOLUTION; RESONATORS; SCATTERING; SEMIMETALS; SURFACE PROPERTIES; X RADIATION
Optional Information
- Notes
- (c) 2006 The American Physical Society