Prediction of contact length, contact pressure and indentation depth of Au/carbon nanotube composite micro electrical contact using finite element modeling
Creators
- 1. Department of Electrical and Electronics Engineering, SRM Institute of Science and Technology, Kattankulathur Campus, Chennai, Tamilnadu, 603 203 (India)
Description
In this paper, electrical contact surfaces are investigated to predict and visualize the contact length, contact pressure and indentation depth under applied force. CNT-CNT, Au-CNT, AuAu, and Au/CNT-Au/CNT contact pairs have been considered for the analysis. Finite Element Modeling (FEM) and analysis is carried out for 2D, semi-circle-square microelectrical contact using COMSOL multiphysics simulation tool. Predicted values are compared with the Hertz model analytical calculations. Contact length and indentation depth of Au/CNT-Au/CNT>Au-Au>Au-CNT>CNT-CNT on the application of force. Also the contact pressure of Au/CNT-Au/CNT2–02.68 GN/m2 and indentation depth of 8.14 nm–12.05 nm are observed. These results would be useful in the design of electrical contacts, RF ohmic contacts, nanoelectromechanical system relays, microelectromechanical system switches, nanomanufacturing, and material characterization.
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2019.05.169;
- PII
- S0169433219314771;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 489
- Journal Page Range
- p. 470-476
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55054082
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CARBON NANOTUBES; COMPUTERIZED SIMULATION; DESIGN; ELECTRIC CONTACTS; FINITE ELEMENT METHOD; MEMS; NEMS; SURFACES
- Descriptors DEC
- CALCULATION METHODS; CARBON; ELECTRICAL EQUIPMENT; ELEMENTS; EQUIPMENT; MATHEMATICAL SOLUTIONS; NANOSTRUCTURES; NANOTUBES; NONMETALS; NUMERICAL SOLUTION; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.