Positron annihilation spectroscopy investigation of vacancy defects in neutron-irradiated 3C -SiC
Creators
- 1. Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- 2. University of Tennessee, Knoxville, TN (United States)
Description
We described positron annihilation spectroscopy characterization results for neutron-irradiated 3 C -SiC, with a specific focus on explaining the size and character of vacancy clusters as a complement to the current understanding of the neutron irradiation response of 3 C -SiC. Positron annihilation lifetime spectroscopy was used to capture the irradiation temperature and dose dependence of vacancy defects in 3 C -SiC following neutron irradiation from 0.01 to 31 dpa in the temperature range from 380C °to 790C .° The neutral and negatively charged vacancy clusters were identified and quantified. The results suggest that the vacancy defects that were measured by positron annihilation spectroscopy technique contribute very little to the transient swelling of SiC. Additionally, we used coincidence Doppler broadening measurement to investigate the chemical identity surrounding the positron trapping sites.Finally, we found that silicon vacancy-related defects dominate in the studied materials and the production of the antisite defect CSi may result in an increase in the probability of positron annihilation with silicon core electrons.
Availability note (English)
Available from http://www.osti.gov/pages/biblio/1360051; DOE Accepted Manuscript full text, or the publishers Best Available Version will be available free of charge after the embargo periodAdditional details
Identifiers
Publishing Information
- Journal Title
- Physical Review B
- Journal Volume
- 95
- Journal Issue
- 10
- Journal Page Range
- vp.
- ISSN
- 2469-9950
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 48102537
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC DISPLACEMENTS; DOPPLER BROADENING; GAMMA SPECTROSCOPY; IRRADIATION; NEUTRONS; POSITRONS; SILICON; SILICON CARBIDES; SWELLING; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; VACANCIES
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; BARYONS; CARBIDES; CARBON COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DEFORMATION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HADRONS; LEPTONS; LINE BROADENING; MATTER; NUCLEONS; PHYSICAL RADIATION EFFECTS; POINT DEFECTS; RADIATION EFFECTS; SEMIMETALS; SILICON COMPOUNDS; SPECTROSCOPY; TEMPERATURE RANGE
Optional Information
- Contract/Grant/Project number
- AC05-00OR22725; SC0006661
- Funding organization
- USDOE Office of Science - SC, Fusion Energy Sciences (FES) (SC-24) (United States)
- Secondary number(s)
- OSTIID--1360051