Published September 1, 2019 | Version v1
Journal article

Normal state interlayer conductivity in epitaxial Nd2–xCexCuO4 films deposited on SrTiO3 (110) single crystal substrates

  • 1. M.N. Miheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences, 18, S. Kovalevskoy St., Ekaterinburg, 620108 (Russian Federation)
  • 2. National Research Nuclear University MEPhI, Moscow (Russian Federation)

Description

In this paper we present the experimental results on the temperature dependences of c-axis resistivity, ρ c (T), for epitaxial films of n-type superconductor Nd2–xCexCuO4+δ deposited on (110) SrTiO3 single crystal substrate in a wide range of Ce content from lightly to heavily substitution regions ( x = 0.12 0.20) under an optimal annealing. Alternative empirical models were used for a description of the observed semiconductor–like ρ c ( T ) dependence. An excellent quantitative depiction of the experimental ρ c ( T ) dependences turned out to be possible for all investigated samples in a model of natural superlattice with temperature - dependent barrier height. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/2053-1591/ab32c8

Additional details

Identifiers

Publishing Information

Journal Title
Materials Research Express (Online)
Journal Volume
6
Journal Issue
9
Journal Page Range
[7 p.]
ISSN
2053-1591