Published March 2018
| Version v1
Journal article
In-situ TEM study of dislocation emission associated with austenite growth
Creators
- 1. Key Laboratory of Advanced Materials (MOE), School of Materials Science and Engineering, Tsinghua University, Beijing 100084 (China)
- 2. CEMES-CNRS, Université de Toulouse, 29 rue J. Marvig, 31055 Toulouse (France)
Description
The emission of dislocations from the tip of a newly transformed austenite lath, with a near Pitsch orientation relationship with the ferrite matrix, was observed at 760 °C in a duplex stainless steel, using in-situ transmission electron microscopy. The dynamics of dislocation loops with [111]b/2 Burgers vector were carefully analyzed. An estimation of stress concentration at the tip was made using dislocations as stress probes. These real-time observations verify directly for the first time that dislocation activity assists the growth of austenite precipitates, and provide quantitative data for revealing the stress field generated by interface migration.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2017.10.014Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2017.10.014;
- PII
- S1359646217306000;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 145
- Journal Page Range
- p. 62-66
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50052940
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AUSTENITE; BURGERS VECTOR; DISLOCATIONS; EMISSION; FERRITE; PRECIPITATION; STAINLESS STEELS; STRESSES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; HIGH ALLOY STEELS; IRON ALLOYS; IRON BASE ALLOYS; LINE DEFECTS; MICROSCOPY; SEPARATION PROCESSES; STEELS; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.