Published May 2014
| Version v1
Journal article
Research on calibration model of X-ray thickness gauge
Creators
- 1. Institute of Nuclear and New Energy Technology, Tsinghua University, Beijing (China)
Description
A new model which describes the attenuation of X-ray in the X-ray thickness gauge was proposed. Based on measured data of several calibration plates whose thickness is already known, this model was compared with other gauging models mentioned in other papers according to different numbers of data points, different data point distributions and other situations. The calculated values with the new model are in good agreement with experimental data. When the number of data points decreases and the distribution of data points changes, the new model maintains a high accuracy and presents a better numerical stability than other models. (authors)
Additional details
Identifiers
Publishing Information
- Journal Title
- Atomic Energy Science and Technology
- Journal Volume
- 48
- Journal Issue
- 5
- Journal Page Range
- p. 925-929
- ISSN
- 1000-6931
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 48088502
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; ATTENUATION; CALIBRATION; PLATES; STABILITY; THICKNESS; THICKNESS GAGES; X RADIATION
- Descriptors DEC
- DIMENSIONS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATIONS
Optional Information
- Notes
- 2 figs., 4 tabs., 4 refs.; http://dx.doi.org/10.7538/yzk.2014.48.05.0925