Published 1996 | Version v1
Miscellaneous Open

Electroluminescence of spark-processed silicon

  • 1. University of New South Wales, Sydney, NSW (Australia). School of Physics

Description

We have successfully fabricated spark-processed silicon to produce electroluminescence that can be readily seen under semi-dark conditions when about 10V pulses with a duty cycle of 50% sre applied to the sample. The samples were lightly spark- processed. After spark-processing, a layer of semitransparent metal was evaporated onto the surface of the sample as electrode and a layer of Al on the back as ohmic contact. The electroluminescence spectrum is measured with narrow band filters and a Si diode detector plus pre-amplifier. From the spectrum, the peak around 650 nm matches what is seen with naked eye. XPS measurements show that the sample is composed mostly of Si and a few percent of oxygen. FTIR analysis indicates the existence of only Si-O species. At this stage is suspected that the light emission from spark-processed silicon may be due to some kinds of nanostructure, either nanosize silicon or nanosize silicon particles in silicon dioxide or both

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Part of:
Twentieth ANZIP condensed matter physics meeting. Conference handbook

Additional details

Publishing Information

Imprint Title
Twentieth ANZIP condensed matter physics meeting. Conference handbook
Imprint Pagination
213 p.
Journal Page Range
p. 100
Report number
INIS-AU--0032

Conference

Title
20. ANZIP annual condensed matter physics meeting
Dates
30 Jan - 2 Feb 1996
Place
Wagga Wagga, NSW (Australia)

INIS

Country of Publication
Australia
Country of Input or Organization
Australia
INIS RN
30033694
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRIC SPARKS; ELECTROLUMINESCENCE; INFRARED SPECTRA; PHOTOELECTRON SPECTROSCOPY; PHYSICAL RADIATION EFFECTS; SILICON; SURFACE TREATMENTS; X-RAY SPECTROSCOPY
Descriptors DEC
ELECTRIC DISCHARGES; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; LUMINESCENCE; PHOTON EMISSION; RADIATION EFFECTS; SEMIMETALS; SPECTRA; SPECTROSCOPY

Optional Information

Notes
2 refs., 2 figs.