Published August 4, 2003
| Version v1
Journal article
Femtosecond electron diffraction for direct measurement of ultrafast atomic motions
Description
We have developed a femtosecond electron diffraction system capable of directly measuring the complete transient structures with atomic level detail and on 400-fs time scale in solid materials. Additionally, a diffraction image with significant signal-to-noise ratio to reveal the long-range order can be obtained with a single electron pulse of 700 fs in duration. A direct observation of ultrafast lattice expansion following the irradiation of femtosecond pulsed laser of Ag film has been demonstrated
Additional details
Identifiers
- DOI
- 10.1063/1.1593831;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 83
- Journal Issue
- 5
- Journal Page Range
- p. 1044-1046
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35048179
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ELECTRON-PHONON COUPLING; LASER RADIATION; ORDER-DISORDER TRANSFORMATIONS; PHYSICAL RADIATION EFFECTS; SIGNAL-TO-NOISE RATIO; SILVER; THIN FILMS; TRANSIENTS
- Descriptors DEC
- COHERENT SCATTERING; COUPLING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; METALS; PHASE TRANSFORMATIONS; RADIATION EFFECTS; RADIATIONS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2003 American Institute of Physics.