Published September 1, 2017 | Version v1
Journal article Metadata-only

Accurate Evaluation of Aberration for Probe-Forming System and Influence of Aberration on High-Resolution STEM image

Creators

  • 1. ePSIC: Electron Physical Sciences Imaging Centre, Diamond Light Source Ltd, Didcot, Oxford, OX11 0DE (United Kingdom)
  • 2. BioNet Laboratory Inc., 2-3-28 Nishiki-chou, Tachikawa, Tokyo, 190-0022 Japan (Japan)

Description

The influence of residual three-fold astigmatism on high-resolution STEM imaging of graphene has been investigated. The aberration was measured by the segmented Ronchigram auto-correlation function method using the graphene lattice. In the presence of residual threefold astigmatism the graphene lattice showed a lower three-fold rotational symmetry where three C atoms in the six membered ring had a higher intensity. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/902/1/012012

Additional details

Identifiers

DOI
10.1088/1742-6596/902/1/012012;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
902
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49067224
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ATOMS; CORRELATION FUNCTIONS; CORRELATIONS; EVALUATION; GRAPHENE; RESOLUTION; SYMMETRY
Descriptors DEC
CARBON; ELEMENTS; FUNCTIONS; NONMETALS