Published April 7, 2015 | Version v1
Journal article

Temperature dependence of the electronic transitions in BiFeO3 thin film studied by spectroscopic ellipsometry

  • 1. Department of Physics and Astronomy, Seoul National University, Seoul 151-742 (Korea, Republic of)
  • 2. Center for Correlated Electron Systems, Institute for Basic Science, Seoul 151-742 (Korea, Republic of)
  • 3. Department of Physics, Hanyang University, Seoul 133-791 (Korea, Republic of)

Description

The temperature dependence of the electronic response of BiFeO3 thin film grown on a SrTiO3 substrate is investigated using spectroscopic ellipsometry. By analyzing the pseudodielectric function, we identify two d-d crystal field transitions of Fe3+ ions in the energy region between 1 and 2 eV. The d-d transitions show abnormal temperature dependence that cannot be attributed to conventional electron-phonon interactions. The origin of the abnormal temperature dependence is discussed in terms of spin-charge coupling. The temperature dependence of the charge transfer transitions located above 2.5 eV is characterized by standard critical point model analysis of the 2nd derivatives of the dielectric function. This analysis provides detailed information of the critical point parameters for charge transfer transitions

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
117
Journal Issue
13
Journal Page Range
p. 134107-134107.6
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

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