Published July 2003 | Version v1
Journal article Metadata-only

Crosstalk problems in scanning-by-probe atomic force microscopy

Creators

  • 1. Department of Mechanical Engineering, Technion, Haifa 32000 (Israel)

Description

Crosstalk problems in fixed optics scanning-by-probe atomic force microscopy are demonstrated by scanning a commercially available calibration grating. It is found that this scanning-by-probe scheme significantly distorts contact response detection, and may even indicate false cantilever deformation when the scanning unit grossly displaces an undeformed cantilever. A compensating electronic circuit that can successfully correct this distortion is presented

Additional details

Identifiers

DOI
10.1063/1.1581357;

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
74
Journal Issue
7
Journal Page Range
p. 3569-3571
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35057560
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CALIBRATION; DEFORMATION; ELECTRONIC CIRCUITS; GRATINGS; PROBES
Descriptors DEC
MICROSCOPY

Optional Information

Notes
(c) 2003 American Institute of Physics.