Modeling of diamond radiation detectors
Creators
- 1. Physics Department, King's College London, Strand, London WC2R 2LS (United Kingdom)
Description
We have built up a computer simulation of the detection mechanism in the diamond radiation detectors. The diamond detectors can be fabricated from a chemical vapour deposition polycrystalline diamond film. In this case, the trapping-detrapping and recombination at the defects inside the grains and at the grain boundaries degrade the transport properties of the material and the charge induction processes. These effects may strongly influence the device's response. Previous simulations of this kind of phenomena in the diamond detectors have generally been restricted to the simple detector geometries and homogeneous distribution of the defects. In our model, the diamond film (diamond detector) is simulated by a grid. We apply a spatial and time discretization, regulated by the grid resolution, to the equations describing the charge transport and, by using the Shockley-Ramo theorem, we calculate the signal induced on the electrodes. In this way, we can simulate the effects of the nonhomogeneous distributions of the trapping, recombination, or scattering centers and can investigate the differences observed when different particles, energies, and electrode configurations are used. The simulation shows that the efficiency of the detector increases linearly with the average grain size, that the charge collection distance is small compared to the dimensions of a single grain, and that for small grains, the trapping at the intragrain defects is insignificant compared to the effect of the grain boundaries
Additional details
Identifiers
- DOI
- 10.1063/1.1804620;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 96
- Journal Issue
- 10
- Journal Page Range
- p. 5845-5851
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36096823
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHARGE COLLECTION; CHARGE TRANSPORT; CHEMICAL VAPOR DEPOSITION; COMPUTERIZED SIMULATION; DIAMONDS; ELECTRON MOBILITY; GRAIN BOUNDARIES; GRAIN SIZE; HOLE MOBILITY; POINT DEFECTS; POLYCRYSTALS; RECOMBINATION; SCATTERING; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SIGNALS; THIN FILMS; TRAPPING
- Descriptors DEC
- CARBON; CHEMICAL COATING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DEPOSITION; ELEMENTS; FILMS; MATERIALS; MEASURING INSTRUMENTS; MICROSTRUCTURE; MINERALS; MOBILITY; NONMETALS; PARTICLE MOBILITY; RADIATION DETECTORS; SIMULATION; SIZE; SURFACE COATING
Optional Information
- Notes
- (c) 2004 American Institute of Physics