A novel transfer-learning method based on selective normalization for fault diagnosis with limited labeled data
- 1. College of Mechanical and Electronic Engineering, Shandong University of Science and Technology, Qingdao 266000 (China)
Description
The application of deep learning to fault diagnosis has made encouraging progress in recent years. However, it is hard to obtain sufficient labeled data to ensure the performance of diagnostic models, due to complex and varying working conditions. Over-fitting often occurs when few labeled data are used in training. To address this crucial problem, a novel transfer-learning method called the selective normalized multiscale convolutional adversarial network (SNMCAN) is proposed in this paper. The proposed model introduces multiscale convolutional neural networks (CNNs) to capture rich fault feature information at multiple scales. A batch normalization (BN) module, widely used in CNNs, is reconstructed into a new normalization method called 'selective normalization' to learn diagnostic knowledge from a pre-trained model and avoid over-fitting with limited labeled data. Joint maximum mean discrepancy (JMMD) is applied to minimize the joint distribution discrepancy between different domains and improve the results of domain alignment. An adversarial training strategy is also used in the proposed model to easily distinguish the distributions of the source and target domains. The superiority of the proposed method is demonstrated using two case studies. The case study results demonstrate that the SNMCAN can achieve better performance in fault diagnosis than comparison methods. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6501/ac03e5Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 32
- Journal Issue
- 10
- Journal Page Range
- [16 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53053121
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPLEXES; FAULT TREE ANALYSIS; MACHINE LEARNING; NEURAL NETWORKS; PERFORMANCE
- Descriptors DEC
- ALGORITHMS; ARTIFICIAL INTELLIGENCE; LEARNING; MATHEMATICAL LOGIC; SYSTEM FAILURE ANALYSIS; SYSTEMS ANALYSIS