Published October 1, 2021 | Version v1
Journal article

A novel transfer-learning method based on selective normalization for fault diagnosis with limited labeled data

  • 1. College of Mechanical and Electronic Engineering, Shandong University of Science and Technology, Qingdao 266000 (China)

Description

The application of deep learning to fault diagnosis has made encouraging progress in recent years. However, it is hard to obtain sufficient labeled data to ensure the performance of diagnostic models, due to complex and varying working conditions. Over-fitting often occurs when few labeled data are used in training. To address this crucial problem, a novel transfer-learning method called the selective normalized multiscale convolutional adversarial network (SNMCAN) is proposed in this paper. The proposed model introduces multiscale convolutional neural networks (CNNs) to capture rich fault feature information at multiple scales. A batch normalization (BN) module, widely used in CNNs, is reconstructed into a new normalization method called 'selective normalization' to learn diagnostic knowledge from a pre-trained model and avoid over-fitting with limited labeled data. Joint maximum mean discrepancy (JMMD) is applied to minimize the joint distribution discrepancy between different domains and improve the results of domain alignment. An adversarial training strategy is also used in the proposed model to easily distinguish the distributions of the source and target domains. The superiority of the proposed method is demonstrated using two case studies. The case study results demonstrate that the SNMCAN can achieve better performance in fault diagnosis than comparison methods. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6501/ac03e5

Additional details

Identifiers

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
32
Journal Issue
10
Journal Page Range
[16 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
53053121
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COMPLEXES; FAULT TREE ANALYSIS; MACHINE LEARNING; NEURAL NETWORKS; PERFORMANCE
Descriptors DEC
ALGORITHMS; ARTIFICIAL INTELLIGENCE; LEARNING; MATHEMATICAL LOGIC; SYSTEM FAILURE ANALYSIS; SYSTEMS ANALYSIS