First measurements with a diamond microstrip detector
Creators
- 1. St. Gobain/Norton Diamond Film, Goddard Rd., Northboro, MA 01532 (United States)
- 2. LEPSI, CRN Strasbourg 67037 (France)
- 3. The Ohio State University, Columbus, OH 43210 (United States)
- 4. Livermore National Laboratory, Livermore, CA 94551 (United States)
- 5. Imperial College, Prince Consort Rd., London SW7 2AZ (United Kingdom)
- 6. University of Oslo, 0316 Oslo 3 (Norway)
- 7. Rutgers University, Piscataway, NJ 08855-0849 (United States)
- 8. European Organization for Nuclear Research, Geneva (Switzerland)
Description
We have constructed the first high resolution strip detector using chemical vapor deposited diamond as the detection medium. Devices produced with this material have the possibility of being extremely radiation hard with direct applications at high luminosity colliders. This paper details the detector material, the low noise readout electronics and the detector module. First results from a test with high momentum charged particles in a testbeam at CERN are described. We achieved a signal-to-noise of 6 : 1 and an efficiency of 85% for minimum ionizing particles in the testbeam. The detector has a strip pitch of 100 μm and a strip width of 50 μm. The measured position resolution we achieved was σ=26 μm. Future development of diamond detectors with application in particle physics experiments and other fields is discussed. ((orig.))
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 354
- Journal Issue
- 2-3
- Journal Page Range
- p. 318-327.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 26041829
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAM LUMINOSITY; CHARGED PARTICLES; COLLIDING BEAMS; DIAMONDS; EFFICIENCY; NOISE; READOUT SYSTEMS; SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; THIN FILMS
- Descriptors DEC
- BEAMS; CARBON; ELEMENTS; FILMS; MEASURING INSTRUMENTS; MINERALS; NONMETALS; RADIATION DETECTORS; RESOLUTION