A high-resolution multi-slit phase space measurement technique for low-emittance beams

Precise measurement of transverse phase space of a high-brightness electron beamis of fundamental importance in modern accelerators and free-electron lasers. Often, the transverse phase space of a high-brightness, space-charge-dominated electron beam is measured using a multi-slit method. In this method, a transverse mask (slit/pepperpot) samples the beaminto a set of beamlets, which are then analyzed on to a screen downstream. The resolution in this method is limited by the type of screen used which is typically around 20 μm for a high-sensitivity Yttrium Aluminum Garnet screen. Accurate measurement of sub-micron transverse emittance using this method would require a long drift space between the multi-slit mask and observation screen. In this paper, we explore a variation of the technique that incorporates quadrupole magnets between the multi-slit mask and the screen. It is shown that this arrangement can improve the resolution of the transverse-phase-space measurement with in a short footprint.