The generation lifetime damage factor and its variance in silicon
- 1. Naval Research Lab., Washington DC (USA)
- 2. Mission Research Corp., San Diego, CA (USA)
- 3. General Electric Co., Pittsfield, MA (USA)
Description
The generation damage factor and its variance for silicon are determined for proton energies of 12, 22, and 63 MeV, and for fission neutrons. Measurement of the variance is made for the first time using 61,504 pixels of a charge injection device. The variance is an intrinsic characteristic of damage due in part to differences in numbers and magnitudes of atomic recoils produced in each pixel. New calculations of the variance due to the recoil spectrum show that the magnitude of the relative variance is determined by coulombic recoils. The experimental relative variance is almost two orders of magnitude less for fission neutron induced dark current increases than for the proton case. Also, the relative variance was found to decrease as the proton energy was increased. The calculation shows that this trend is caused by the inelastic contribution to the relative variance of the recoil spectrum
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 36
- Journal Issue
- 6
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 1872-1881
- ISSN
- 0018-9499
- CODEN
- IETNA
Conference
- Title
- 26. annual conference on nuclear and space radiation effects.
- Dates
- 25-29 Jul 1989.
- Place
- Marco Island, FL (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21058088
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARRIER LIFETIME; CHARGE DISTRIBUTION; CURRENT DENSITY; ENERGY SPECTRA; FISSION NEUTRONS; INELASTIC SCATTERING; MEV RANGE 10-100; PROTON RECOIL DETECTORS; PROTONS; RADIATION HARDENING; RECOILS; SILICON
- Descriptors DEC
- BARYONS; CATIONS; CHARGED PARTICLES; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; HADRONS; HARDENING; HYDROGEN IONS; HYDROGEN IONS 1 PLUS; IONS; LIFETIME; MEASURING INSTRUMENTS; MEV RANGE; NEUTRON DETECTORS; NEUTRONS; NUCLEONS; PHYSICAL RADIATION EFFECTS; RADIATION DETECTORS; RADIATION EFFECTS; SCATTERING; SEMIMETALS; SPECTRA
Optional Information
- Secondary number(s)
- CONF-890723--.