Published May 15, 2008 | Version v1
Journal article Metadata-only

Synthesis and characteristics of nanocrystalline Co/N thin film containing Co4N phase

Creators

  • 1. School of Physics, Beihua University, Jilin, 132021 (China)
  • 2. Department of Materials Science, Key Laboratory of Automobile Materials of MOE, Jilin University, Changchun, 130012 (China)
  • 3. State Key Laboratory of Inorganic Synthesis and Preparative Chemistry, College of Chemistry, Jilin University, Changchun, 130012 (China)

Description

Nanocrystalline Co/N thin film containing Co4N phase has been deposited on Si (1 1 1) substrate by direct current magnetron sputtering in 10% N2/N2 + Ar discharge. The composition, structure and magnetic properties were examined by X-ray photoelectron spectroscopy, X-ray diffraction (XRD), transmission electron microscopy (TEM) and superconducting quantum interference device. XRD and TEM investigations showed that the grain size of nanocrystalline Co4N was in the range 10-25 nm (with the error of ±0.2 nm). Magnetic analysis indicated that the synthesized Co/N thin films had good in-plane anisotropy. The value of Hc with the domination orientation (1 1 1) was about 97 Oe. The saturation magnetization was estimated to be 103.9 ± 6.1 emu/g, which was larger than the value of 46.5 emu/g firstly reported by Oda et al

Availability note (English)

Available from http://dx.doi.org/10.1016/j.mseb.2008.03.001

Additional details

Identifiers

DOI
10.1016/j.mseb.2008.03.001;
PII
S0921-5107(08)00109-8;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
150
Journal Issue
2
Journal Page Range
p. 121-124
ISSN
0921-5107
CODEN
MSBTEK

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40036280
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANISOTROPY; COBALT; COBALT COMPOUNDS; CRYSTALS; DIRECT CURRENT; GRAIN SIZE; MAGNETIC PROPERTIES; MAGNETRONS; NANOSTRUCTURES; NITRIDES; NITROGEN; SPUTTERING; SQUID DEVICES; SYNTHESIS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
COHERENT SCATTERING; CURRENTS; DIFFRACTION; ELECTRIC CURRENTS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUXMETERS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; MICROSTRUCTURE; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NITROGEN COMPOUNDS; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; PNICTIDES; SCATTERING; SIZE; SPECTROSCOPY; SUPERCONDUCTING DEVICES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.