Published 1994 | Version v1
Book

Nuclear evaluation of PZT thin films for non volatile memories

  • 1. Thomson-CSF, 92 - Bagneux (France)
  • 2. Thomson-CSF, 91 - Orsay-Corbeville (France)

Description

Total dose, dose rate and neutron tests have been performed on PZT thin films made by a sol-gel process. The possibility of using these ferroelectric capacitors for radiation hardened ferroelectric memories is demonstrated. (author). 18 refs., 10 figs., 3 tabs

Part of:
Radiation and its effects on components and systems

Additional details

Publishing Information

Publisher
Commissariat a l'Energie Atomique.
Imprint Place
Bruyeres-le-Chatel (France)
Imprint Title
Radiation and its effects on components and systems
Imprint Pagination
596 p.
Journal Page Range
p. 166-173.

Conference

Title
2. European Conference on Radiation and its Effects on Components and Systems.
Dates
13-16 Sep 1993.
Place
Saint-Malo (France).

Optional Information