Electron diffraction structure analysis: some results and prospects of the development

Developments in the fields of high resolution electron microscopy and electron diffraction structure analysis are reviewed. Characteristics of different electron diffraction patterns are pointed out and the essential differences in the structure analysis based on electron diffraction patterns and X-ray diffraction patterns, are stressed. Observations made on: (i) hydrogen-containing structures, (ii) carbides and nitrides of transition metals, (iii) oxides of V, Nb, Ta and (iv) semiconductor compounds, are summarised. The future trends in this field are indicated. (author)