Published June 15, 2014 | Version v1
Journal article

Room temperature ferromagnetism in Cd-doped ZnO thin films through defect engineering

  • 1. Laboratoire de la matière condensée et nanosciences, Département de Physique, Faculté des Sciences de Monastir, 5019 Monastir (Tunisia)
  • 2. College of Arts and Science Nayriya, Dammam University, 31441 Dammam (Saudi Arabia)
  • 3. Laboratoire Physico-Chimie des Matériaux, Unité de Service Commun de Recherche ''High Resolution X-ray Diffractometer'', Département de Physique, Université de Monastir, Faculté des Sciences de Monastir, Avenue de l'Environnement, 5019 Monastir (Tunisia)
  • 4. Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS) UMR 7504 CNRS-Université de Strasbourg, 23 rue du Loess, BP 43, 67034 Strasbourg Cedex 2 (France)

Description

Highlights: • ZnO:Cd thin film grown on c-sapphire substrate by MOCVD method. • RTFM in ZnO:Cd thin film is detected by SQUID magnetometer measurement. • DFT theory is conducted to elucidate the mechanism of RTFM in Cd-doped ZnO. - Abstract: Room-temperature ferromagnetism is detected in undoped and cadmium-doped ZnO (ZnO:Cd) thin film grown on c-plane sapphire substrate by metal–organic chemical vapor deposition method. To elucidate the origin of ferromagnetism, a theoretical study based on density functional theory is conducted, focusing on the role of the neutral cation vacancy on the appearance of magnetism in Cd-doped ZnO thin film. The calculations revealed that Cd substitution at Zn sites contributes to the long-ranged ferromagnetism in ZnO by lowering the formation energy of Zn vacancies and thereby stabilizing Zn vacancies from which the magnetic moments originate

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2014.01.247

Additional details

Identifiers

DOI
10.1016/j.jallcom.2014.01.247;
PII
S0925-8388(14)00339-9;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
598
Journal Page Range
p. 120-125
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.