A combinatorial study on the influence of elemental composition and heat treatment on the phase composition, microstructure and mechanical properties of Ni-W alloy thin films
- 1. Laboratory for Nanometallurgy, Department of Materials, ETH Zurich, Wolfgang-Pauli-Strasse 10, 8093 Zurich (Switzerland)
Description
Ni-W alloys are promising materials for applications where mechanical stability at relatively high temperature is required. Several Ni-W thin film gradients were synthesized by magnetron sputtering spanning the entire binary composition range. Microstructure and phase composition were characterized by means of X-ray diffraction and transmission electron microscopy, while the mechanical properties were assessed using nanoindentation. As-deposited films exhibit non-equilibrium phases such as amorphous phases in the center of the phase diagram and β-tungsten in the tungsten-rich regime. After annealing, a new X-phase is observed in the center of the phase diagram and non-equilibrium phase compositions are observed for most compositions, such as the presence of α-tungsten at a composition of 75% Ni. Microstructure and composition were successfully correlated to the mechanical properties.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2010.09.045Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2010.09.045;
- PII
- S1359-6454(10)00622-1;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 59
- Journal Issue
- 1
- Journal Page Range
- p. 386-399
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43042324
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; AMORPHOUS STATE; ANNEALING; MAGNETRONS; MATERIALS; MECHANICAL PROPERTIES; MICROSTRUCTURE; PHASE DIAGRAMS; SPUTTERING; STABILITY; TEMPERATURE RANGE 0400-1000 K; TEXTURE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN-ALPHA; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIAGRAMS; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; HEAT TREATMENTS; INFORMATION; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; REFRACTORY METALS; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENTS; TUNGSTEN
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.