Non-contact measurement of dc voltages using nonlinear elements
Creators
- 1. Electrical, Electronic and Computer Engineering, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh (United Kingdom)
Description
In this work, it is shown that dc voltages may be measured via a capacitive interface, provided that the capacitance between the measurement system and the dc voltage source being measured is nonlinearized. This nonlinearization is achieved by the addition of a nonlinear capacitor in series with the coupling capacitance. Two types of nonlinear capacitor are used—multilayer ceramics and varicap diodes. Currently available multilayer ceramics have a larger value than desired but prove the concept, while the small capacitance of the varicap diode allows measurement on real wires. Results show that over a low voltage range (−8 V to +8 V), the voltage on a conductor can be measured if the coupling capacitance between source and electrode is larger than 20 pF, which equates to an electrode length of 5 cm when wire compliant with MIL-W-81044-22 is used. Detection is performed by momentarily applying a voltage at a node within the measurement system, then measuring the time it takes for this voltage to decay to a threshold level—the capacitive nonlinearity causes this time delay to be dependent upon the dc input voltage whose value is being measured. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/23/4/045001Additional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 23
- Journal Issue
- 4
- Journal Page Range
- [10 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46016066
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CAPACITANCE; CAPACITORS; CERAMICS; COUPLING; DETECTION; ELECTRIC POTENTIAL; ELECTRODES; INTERFACES; LAYERS; NONLINEAR PROBLEMS; SEMICONDUCTOR DIODES; TIME DELAY; VOLTMETERS
- Descriptors DEC
- ELECTRIC MEASURING INSTRUMENTS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES