Continuous ultra-thin MoS2 films grown by low-temperature physical vapor deposition
Creators
- 1. Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson AFB, Ohio 45433 (United States)
- 2. Department of Chemical and Materials Engineering, University of Dayton, Dayton, Ohio 45469 (United States)
- 3. University of Dayton Research Institute, Dayton, Ohio 45469 (United States)
- 4. Department of Mechanical and Nuclear Engineering, Pennsylvania State University, College Park, Pennsylvania 16802 (United States)
Description
Uniform growth of pristine two dimensional (2D) materials over large areas at lower temperatures without sacrifice of their unique physical properties is a critical pre-requisite for seamless integration of next-generation van der Waals heterostructures into functional devices. This Letter describes a vapor phase growth technique for precisely controlled synthesis of continuous, uniform molecular layers of MoS2 on silicon dioxide and highly oriented pyrolitic graphite substrates of over several square centimeters at 350 °C. Synthesis of few-layer MoS2 in this ultra-high vacuum physical vapor deposition process yields materials with key optical and electronic properties identical to exfoliated layers. The films are composed of nano-scale domains with strong chemical binding between domain boundaries, allowing lift-off from the substrate and electronic transport measurements from contacts with separation on the order of centimeters.
Additional details
Identifiers
- DOI
- 10.1063/1.4885391;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 104
- Journal Issue
- 26
- Journal Page Range
- p. 261604-261604.5
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46010634
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL GROWTH; EQUIPMENT; FILMS; GRAPHITE; LAYERS; MOLYBDENUM SULFIDES; PHYSICAL PROPERTIES; PHYSICAL VAPOR DEPOSITION; SILICON OXIDES; SUBSTRATES; SYNTHESIS; TEMPERATURE RANGE 0400-1000 K; VAN DER WAALS FORCES
- Descriptors DEC
- CARBON; CHALCOGENIDES; DEPOSITION; ELEMENTS; MINERALS; MOLYBDENUM COMPOUNDS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; SILICON COMPOUNDS; SULFIDES; SULFUR COMPOUNDS; SURFACE COATING; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC