Published July 2003
| Version v1
Journal article
A study for the bias control of indium-tin-oxide films synthesized by cesium assisted radio frequency magnetron sputtering
- 1. Department of Metallurgical Engineering, Yonsei University, Seoul 120-749 (Korea, Republic of)
- 2. Department of Applied Physics, Konkuk University, Chungju 380-701 (Korea, Republic of)
- 3. Department of Materials Science and Engineering, Kyungsung University, Busan 608-736 (Korea, Republic of)
Description
In order to synthesize low resistive and high transparent indium-tin-oxide (ITO) films at room temperature, cesium assisted rf plasma sputtering was performed with additional substrate bias. We tried to control positive ions by negative substrate bias and negative ions by positive substrate bias. Plasma parameters, such as plasma density and electron temperature, were also controlled by the addition of cesium. The lowest specific resistivity of 4.4x10-4 Ω cm and high preferred oriented plane of (400) spectra from x-ray diffraction were obtained at the deposition condition of -100 V substrate bias. Our method proves to be very effective in low temperature growth of high quality ITO films
Additional details
Identifiers
- DOI
- 10.1116/1.1584038;
Publishing Information
- Journal Title
- Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
- Journal Volume
- 21
- Journal Issue
- 4
- Journal Page Range
- p. 1069-1072
- ISSN
- 0734-2101
- CODEN
- JVTAD6
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35024416
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- INDIUM OXIDES; MAGNETRONS; PLASMA DENSITY; RF SYSTEMS; SPUTTERING; TIN OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; INDIUM COMPOUNDS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; SCATTERING; TIN COMPOUNDS
Optional Information
- Notes
- (c) 2003 American Vacuum Society.