Published June 30, 2004
| Version v1
Journal article
Elaboration and characterizations of oligoaniline thin films
Description
Thin films of vacuum sublimated [4-(phenylamino) phenyl]-1,4-benzenediamine were elaborated by changing deposition parameters. The influence of these parameters on the structural organization of the films is studied by several techniques, such as X-ray diffraction, Scanning Electron Microscopy, UV-vis-NIR optical and polarized infrared absorption. All these results are discussed by comparison to a similar previous study of N,N'-diphenyl-1,4-phenylenediamine and reveal that, using convenient deposition parameters, one can obtain textured films, in which the organic molecules stand almost perpendicular to the substrate. Preliminary doping experiment of these films is presented in the aim of potential use in sensor devices
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2003.11.314;
- PII
- S004060900301993X;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 458
- Journal Issue
- 1-2
- Journal Page Range
- p. 32-36
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37016902
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; AMINES; AROMATICS; COMPARATIVE EVALUATIONS; DEPOSITION; INFRARED SPECTRA; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EVALUATION; FILMS; MICROSCOPY; ORGANIC COMPOUNDS; SCATTERING; SPECTRA; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.