Published June 30, 2004 | Version v1
Journal article

Elaboration and characterizations of oligoaniline thin films

Description

Thin films of vacuum sublimated [4-(phenylamino) phenyl]-1,4-benzenediamine were elaborated by changing deposition parameters. The influence of these parameters on the structural organization of the films is studied by several techniques, such as X-ray diffraction, Scanning Electron Microscopy, UV-vis-NIR optical and polarized infrared absorption. All these results are discussed by comparison to a similar previous study of N,N'-diphenyl-1,4-phenylenediamine and reveal that, using convenient deposition parameters, one can obtain textured films, in which the organic molecules stand almost perpendicular to the substrate. Preliminary doping experiment of these films is presented in the aim of potential use in sensor devices

Additional details

Identifiers

DOI
10.1016/j.tsf.2003.11.314;
PII
S004060900301993X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
458
Journal Issue
1-2
Journal Page Range
p. 32-36
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37016902
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ABSORPTION SPECTROSCOPY; AMINES; AROMATICS; COMPARATIVE EVALUATIONS; DEPOSITION; INFRARED SPECTRA; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EVALUATION; FILMS; MICROSCOPY; ORGANIC COMPOUNDS; SCATTERING; SPECTRA; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.