Behavior of HgI2 nuclear detectors irradiated with high x-ray fluences
Description
Nuclear detectors of HgI2 exposed to high fluences of up to 40 keV x-rays of counting rates up to 1012 photons sec-1 cm-2 which correspond to about 400 R/min show linear dependence of the dc current of the detector with the x-ray dose. Polarization can cause the deterioration of the dc current within the detector with a decay time which varies from several seconds to several hours at the highest fluence after which the dc current reaches a steady value. Better crystals, however, show practically no time deterioration of the dc current. The dc response of Hgl2 nuclear detectors to high fluences of x-ray pulses of several milliseconds duration was also measured. Both the rise times and decay times varied between 0.4 to 0.8 millisecond for uncollimated and 0.06 to 0.3 millisecond for collimated x-rays
Additional details
Identifiers
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 24
- Journal Issue
- 1
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 148-153
- ISSN
- 0018-9499
Conference
- Title
- 23. nuclear science symposium.
- Dates
- 20 Oct 1976.
- Place
- New Orleans, LA, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 8344118
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COUNTING RATES; DIRECT CURRENT; HGI2 SEMICONDUCTOR DETECTORS; KEV RANGE 01-10; KEV RANGE 10-100; POLARIZATION; PULSE RISE TIME; SENSITIVITY; X-RAY DETECTION
- Descriptors DEC
- CURRENTS; ELECTRIC CURRENTS; ENERGY RANGE; KEV RANGE; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; TIMING PROPERTIES
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent